By integrating a mid-wave or long-wave infrared (MWIR/LWIR) camera, similar to those used in thermal imaging, into an interferometric setup combined with a broadband infrared source, we aim to achieve deep imaging through diffusive and/or opaque layers such as paints, coatings, plastics, ceramics, or aged varnishes.
Full-Field OCT (FF-OCT) remains largely unexplored in the mid-IR range. This project will therefore address both fundamental questions on infrared light propagation in complex scattering media and applied challenges in several fields. This internship/PhD thesis offers an opportunity to contribute to the development of a new generation of infrared interferometric imaging tools, expanding the reach of OCT beyond its traditional spectral limits. Anticipated applications include :
– Non-destructive testing, particularly for detecting subsurface defects in industrial coatings used in aerospace and advanced manufacturing.
– Cultural heritage analysis, enabling visualization beneath painted surfaces and ceramic glazes.
It will be carried out as part of a collaboration between Institut Langevin (ESPCI Paris, PSL University) and ONERA.
Keywords : Optical coherent tomography, Infrared imaging, Deep subsurface imaging, Scattering materials for aviation and space industry, Non-destructive testing, Cultural heritage
Description of the work : 100% Experimental (optical bench development, performance characterization and measurements, possibility of materials fabrication and characterization and of optical simulations) (to be discussed)
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Contact :
| Yannick DE WILDE Tél. : 01 80 96 30 84  |
